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A nonparametric approach to estimate system burn-in time
- Source :
- IEEE Transactions on Semiconductor Manufacturing. August, 1996, Vol. 9 Issue 3, p461, 7 p.
- Publication Year :
- 1996
-
Abstract
- System burn-in can get rid of more residual defects than component and subsystem burn-ins because incompatibility exists not only among components, but also among different subsystems and at the system level. There are two major disadvantages for performing the system burn-in: the high burn-in cost and the complicated failure rate function. This paper proposes a nonparametric approach to estimate the optimal system burn-in time. The Anderson-Darling statistic is used to check the constant failure rate (CFR), and the pool-adjacent-violator (PAV) algorithm is applied to 'unimodalize' the failure rate curve. Given experimental data, the system burn-in time can be determined easily without going through complex parameter estimation and curve fittings.
Details
- ISSN :
- 08946507
- Volume :
- 9
- Issue :
- 3
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Semiconductor Manufacturing
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.18668715