Back to Search Start Over

A nonparametric approach to estimate system burn-in time

Authors :
Chien, Wei-Ting Kary
Kuo, Way
Source :
IEEE Transactions on Semiconductor Manufacturing. August, 1996, Vol. 9 Issue 3, p461, 7 p.
Publication Year :
1996

Abstract

System burn-in can get rid of more residual defects than component and subsystem burn-ins because incompatibility exists not only among components, but also among different subsystems and at the system level. There are two major disadvantages for performing the system burn-in: the high burn-in cost and the complicated failure rate function. This paper proposes a nonparametric approach to estimate the optimal system burn-in time. The Anderson-Darling statistic is used to check the constant failure rate (CFR), and the pool-adjacent-violator (PAV) algorithm is applied to 'unimodalize' the failure rate curve. Given experimental data, the system burn-in time can be determined easily without going through complex parameter estimation and curve fittings.

Details

ISSN :
08946507
Volume :
9
Issue :
3
Database :
Gale General OneFile
Journal :
IEEE Transactions on Semiconductor Manufacturing
Publication Type :
Academic Journal
Accession number :
edsgcl.18668715