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A model of impact ionization due to the primary hole in silicon for a full band Monte Carlo simulation
- Source :
- Journal of Applied Physics. May 15, 1996, Vol. 79 Issue 10, p7718, 8 p.
- Publication Year :
- 1996
- Subjects :
- Monte Carlo method -- Research
Ionization -- Models
Silicon -- Research
Physics
Subjects
Details
- ISSN :
- 00218979
- Volume :
- 79
- Issue :
- 10
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.18694094