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Parametric tip model and force-distance relation for Hamaker constant determination from atomic force microscopy
- Source :
- Journal of Applied Physics. Dec 1, 1996, Vol. 80 Issue 11, p6081, 10 p.
- Publication Year :
- 1996
-
Abstract
- A new parametric tip force-distance relation (PT/FDR) is shown for describing the probe-sample system in atomic force microscopy (AFM). A surface integration technique is designed to calculate the interactions between arbitrarily shaped bodies. The technique is based on the Hamaker pairwise in integration in a continuous fashion, reducing the six-dimensional integration to a four-dimensional procedure. The PT/FDR is derived and a nonlinear fitting process is utilized to extract the model parameters and the Hamaker constant from AFM force-distance data.
- Subjects :
- Atomic force microscopy -- Models
Physics
Subjects
Details
- ISSN :
- 00218979
- Volume :
- 80
- Issue :
- 11
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.19042950