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Self-voting dual-modular-redundancy circuits for single-event-transient mitigation
- Source :
- IEEE Transactions on Nuclear Science. Dec, 2008, Vol. 55 Issue 6, p3435, 5 p.
- Publication Year :
- 2008
-
Abstract
- Dual-modular-redundancy (DMR) architectures use duplication and self-voting asynchronous circuits to mitigate single event transients (SETs). The area and performance of DMR circuitry is evaluated against conventional triple-modular-redundancy (TMR) logic. Benchmark ASIC circuits designed with DMR logic show a 10-24% area improvement for flip-flop designs, and a 33 % improvement for latch designs. Index Terms--Asynchronous circuits, combinational logic, sequential logic, single event effects.
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 55
- Issue :
- 6
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.193342611