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Self-voting dual-modular-redundancy circuits for single-event-transient mitigation

Authors :
Teifel, John
Source :
IEEE Transactions on Nuclear Science. Dec, 2008, Vol. 55 Issue 6, p3435, 5 p.
Publication Year :
2008

Abstract

Dual-modular-redundancy (DMR) architectures use duplication and self-voting asynchronous circuits to mitigate single event transients (SETs). The area and performance of DMR circuitry is evaluated against conventional triple-modular-redundancy (TMR) logic. Benchmark ASIC circuits designed with DMR logic show a 10-24% area improvement for flip-flop designs, and a 33 % improvement for latch designs. Index Terms--Asynchronous circuits, combinational logic, sequential logic, single event effects.

Details

Language :
English
ISSN :
00189499
Volume :
55
Issue :
6
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.193342611