Sine-fit versus discrete Fourier transform-based algorithms in SNR testing of waveform digitizers

MLA

Bertocco, Matteo, and Claudio Narduzzi. “Sine-Fit versus Discrete Fourier Transform-Based Algorithms in SNR Testing of Waveform Digitizers.” IEEE Transactions on Instrumentation & Measurement, vol. v46, no. n2, Apr. 1997, p. 445. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.19787928&authtype=sso&custid=ns315887.

APA

Bertocco, M., & Narduzzi, C. (1997). Sine-fit versus discrete Fourier transform-based algorithms in SNR testing of waveform digitizers. IEEE Transactions on Instrumentation & Measurement, v46(n2), 445.

Chicago

Bertocco, Matteo, and Claudio Narduzzi. 1997. “Sine-Fit versus Discrete Fourier Transform-Based Algorithms in SNR Testing of Waveform Digitizers.” IEEE Transactions on Instrumentation & Measurement v46 (n2): 445. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.19787928&authtype=sso&custid=ns315887.