Algorithms for state restoration and trace-signal selection for data acquisition in silicon debug

Subjects

Subjects :

Embedded system
System on a chip
Debugging -- Analysis
Digital integrated circuits -- Evaluation
Embedded systems -- Analysis

Details

Language :

English

ISSN :

02780070

Volume :

28

Issue :

2

Database :

Gale General OneFile

Journal :

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Publication Type :

Academic Journal

Accession number :

edsgcl.200144777