Modeling testing-strategies for yield enhancement of multichip module systems

Analytic models for yield enhancement test-strategy (TS) evaluation of systems with fault-tolerant (FTol) multichip modules (MCM) were studied. Results reveal that a proposed approach for yield analysis which uses the Least Recently Tested TS can effectively calculate the overall yield for FTol-MCM. Extensive parametric results show that the reliability system of a particular technology can be improved.