Nonlinear optical properties of Si nanocrystals embedded in Si[O.sub.2] prepared by a cosputtering method

Authors :: Imakita, Kenji
Ito, Masahiko
Fujii, Minoru
Hayashi, Shinji
Source :: Journal of Applied Physics. May 1, 2009, Vol. 105 Issue 9, 093531-1-093531-5
Publication Year :: 2009
Abstract: Nonlinear optical properties of Si nanocrystals (Si-ncs) doped Si[O.sub.2] prepared by a cosputtering method are analyzed by z-scan method in a femtosecond regime at around 1.6 eV. The nonlinear refractive index and nonlinear absorption coefficient are enhanced when compared to those of bulk Si.

Subjects :: Nonlinear optics -- Analysis
Refractive index -- Measurement
Silicon -- Electric properties
Silicon -- Optical properties
Sputtering (Physics) -- Usage
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