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Electroreflectance of surface-intrinsic- n+-type doped GaAs

Authors :
Wang, D.P.
Huang, K.M.
Shen, T.L.
Huang, K.F.
Huang, T.C.
Source :
Journal of Applied Physics. Sept 15, 1997, Vol. 82 Issue 6, p3089, 3 p.
Publication Year :
1997

Abstract

Measurements of the electroreflectance spectra of surface-intrinsic- n+-type-doped GaAs at various bias voltages (Vbias) were conducted. Findings indicate many Franz-Keldysh oscillations (FKOs) above the band-gap energy which were attributed to a uniform electric field (F) in the undoped layer below the surface. No other evidence for the uniformity of F in the undoped layer was observed. Since F can be deduced from the periods of the FKOs, the relations between Vbias an F can be obtained. Thus, the relation confirms the existence of a nearly uniform field in the undoped layer.

Details

ISSN :
00218979
Volume :
82
Issue :
6
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.20300759