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Electroreflectance of surface-intrinsic- n+-type doped GaAs
- Source :
- Journal of Applied Physics. Sept 15, 1997, Vol. 82 Issue 6, p3089, 3 p.
- Publication Year :
- 1997
-
Abstract
- Measurements of the electroreflectance spectra of surface-intrinsic- n+-type-doped GaAs at various bias voltages (Vbias) were conducted. Findings indicate many Franz-Keldysh oscillations (FKOs) above the band-gap energy which were attributed to a uniform electric field (F) in the undoped layer below the surface. No other evidence for the uniformity of F in the undoped layer was observed. Since F can be deduced from the periods of the FKOs, the relations between Vbias an F can be obtained. Thus, the relation confirms the existence of a nearly uniform field in the undoped layer.
- Subjects :
- Gallium arsenide semiconductors -- Measurement
Physics
Subjects
Details
- ISSN :
- 00218979
- Volume :
- 82
- Issue :
- 6
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.20300759