Sizing up the composition

Coulter Particle Characterization incorporated several advances in laser diffraction technology in its design of the Coulter LS Series of enhanced laser diffraction size analyzers. Errors stemmin from laser alignment have been solved by using a dark field reticle which simulates the action of mono-sized spherical particles to form a circular symmetrical pattern of light scattering, Problems i the resolution of submicrometer analysis was solved using the Polarization Intensity Differential Scattering technique whle the limitations posed by size calculations was surmounted by the use of the Mie theory.