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The anisotropic magnetoresistance in epitaxial thin films and polycrystalline samples of [La.sub.0.65][Ca.sub.0.35]Mn[O.sub.3]

Authors :
Egilmez, M.
Rongchao Ma
Chow, K.H.
Jung, J.
Source :
Journal of Applied Physics. April 1, 2009, Vol. 105 Issue 7, 07D706-1-07D706-3
Publication Year :
2009

Abstract

The anisotropic magnetoresistance (AMR) of epitaxial thin film and polycrystalline samples of [La.sub.0.65][Ca.sub.0.35]Mn[O.sub.3] is measured. At the temperature below the metal-insulator transition (MIT), the AMR of the polycrystalline samples is larger than that of the epitaxial films, showing that the anisotropy of the spin-polarized tunneling of the charge carriers across grain boundaries in a magnetic filed is responsible for the low temperature behavior.

Details

Language :
English
ISSN :
00218979
Volume :
105
Issue :
7
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.205131672