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Evaluation of analog/RF test measurements at the design stage

Authors :
Stratigopoulos, Haralampos-G.
Mir, Salvador
Bounceur, Ahcene
Source :
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. April, 2009, Vol. 28 Issue 4, p582, 9 p.
Publication Year :
2009

Subjects

Subjects :
Analog integrated circuits -- Design and construction
Monte Carlo method -- Usage
Self-test capability (Electronics) -- Evaluation

Details

Language :
English
ISSN :
02780070
Volume :
28
Issue :
4
Database :
Gale General OneFile
Journal :
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Publication Type :
Academic Journal
Accession number :
edsgcl.205952791

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