Microstructural aspects for defect emission and [E.sub.s.sup.high] phonon mode of ZnO thin films

The ZnO thin films are prepared by using a cost-effective vacuum-carbon-arc technique combined with thermal oxidation under ambient conditions from zinc nanoparticles in carbon matrix. The downshift of phonon frequency and linewidth broadening of high frequency [E.sub.2] phonon mode are analyzed through defect state according to annealed conditions.