Characterization of rhenium oxide films and their application to liquid crystal cells

Micro-Raman spectroscopy and x-ray diffraction techniques were used to compare and characterize rhenium oxide thin films obtained by thermal evaporation of Re[O.sub.3] powders on different substrates, maintained at different temperatures and by reactive magnetron sputtering of a Re metallic target. The electrical and electro-optical behaviors of Re[O.sub.3] films deposited on standard indium tin oxide/glass substrate tested inside asymmetric nematic liquid crystal cells showed an ability to rectify their electro-optical response similar to tungsten trioxide.