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Characterization of CdTe detectors for quantitative X-ray spectroscopy

Authors :
Redus, Robert H.
Pantazis, John A.
Pantazis, Thanos J.
Huber, Alan C.
Cross, Brian J.
Source :
IEEE Transactions on Nuclear Science. August, 2009, Vol. 56 Issue 4, p2524, 9 p.
Publication Year :
2009

Subjects

Subjects :
X-ray spectroscopy -- Methods
Silicon diodes -- Materials
Radiation warning systems -- Design and construction
Business
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
00189499
Volume :
56
Issue :
4
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.206852121

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