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Fabrication and electronic characterization of single molecular junction devices: a comprehensive approach
- Source :
- Journal of the American Chemical Society. August 5, 2009, Vol. 131 Issue 30, 10439-10446
- Publication Year :
- 2009
-
Abstract
- A new comprehensive method to combine scanning probe microscopy (SPM) nanolithography and modified SPM break junction techniques to fabricate and characterize single molecular break junction devices is described. The newly designed approach also allowed one to eliminate, or at least minimize, the variations of experimental conditions and enabled the measurement of multiple molecules under the same experiment with exactly the same experimental conditions.
Details
- Language :
- English
- ISSN :
- 00027863
- Volume :
- 131
- Issue :
- 30
- Database :
- Gale General OneFile
- Journal :
- Journal of the American Chemical Society
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.207854660