High-level test synthesis with hierarchical test generation for delay-fault testability

Subjects

Subjects :

Automatic testing equipment -- Evaluation
Electric fault location -- Analysis
Very-large-scale integration -- Evaluation

Details

Language :

English

ISSN :

02780070

Volume :

28

Issue :

10

Database :

Gale General OneFile

Journal :

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Publication Type :

Academic Journal

Accession number :

edsgcl.209454344