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The Fab Line: Applied Materials and Leica Microsystems
- Source :
- Electronic News (1991). August 17, 1998, Vol. 44 Issue 2232, p29, 1 p.
- Publication Year :
- 1998
-
Abstract
- Applied Materials and Leica Microsystems will cooperate to provide customers with a full set of systems for defect detection, classification and source analysis, the companies said. As part of this […]
- Subjects :
- Semiconductor industry
Semiconductor production equipment
Semiconductor device
Cooperative agreement for product development
Electronic test device
Integrated circuit fabrication
Semiconductor production equipment industry
Contract agreement
Leica Microsystems Inc. -- Contracts -- Product development -- Alliances and partnerships
Applied Materials Inc. -- Contracts -- Product development -- Alliances and partnerships
Semiconductor industry -- Contracts -- Product development -- Alliances and partnerships
Testing equipment -- Product development
Semiconductor production equipment industry -- Contracts -- Product development -- Alliances and partnerships
Integrated circuit fabrication
Instrument industry -- Contracts -- Product development -- Alliances and partnerships
Semiconductor production equipment -- Product development
Subjects
Details
- Language :
- English
- ISSN :
- 10616624
- Volume :
- 44
- Issue :
- 2232
- Database :
- Gale General OneFile
- Journal :
- Electronic News (1991)
- Publication Type :
- Periodical
- Accession number :
- edsgcl.21034889