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Intracellular DNA damage induced by non-thermal, intense narrowband electric fields

Authors :
Nomura, Naoyuki
Yano, Masahiko
Katsuki, Sunao
Akiyama, Hidenori
Abe, Keisuke
Abe, Shin-Ichi
Source :
IEEE Transactions on Dielectrics and Electrical Insulation. Oct, 2009, Vol. 16 Issue 5, p1288, 6 p.
Publication Year :
2009

Subjects

Subjects :
Electric fields -- Properties
Ovum -- Genetic aspects
DNA damage -- Research
Business
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
10709878
Volume :
16
Issue :
5
Database :
Gale General OneFile
Journal :
IEEE Transactions on Dielectrics and Electrical Insulation
Publication Type :
Academic Journal
Accession number :
edsgcl.211357064

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