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Analytical evaluation of dielectric breakdown test based on one-minute step-up method

Authors :
Tsuboi, Toshihiro
Takami, Jun
Okabe, Shigemitsu
Hirose, Hideo
Tsuru, Kotaro
Source :
IEEE Transactions on Dielectrics and Electrical Insulation. Oct, 2009, Vol. 16 Issue 5, p1393, 4 p.
Publication Year :
2009

Details

Language :
English
ISSN :
10709878
Volume :
16
Issue :
5
Database :
Gale General OneFile
Journal :
IEEE Transactions on Dielectrics and Electrical Insulation
Publication Type :
Academic Journal
Accession number :
edsgcl.211357076