A high-speed low-noise CMOS image sensor with 13-b column-parallel single-ended cyclic ADCs

Authors :: Park, J.-H.
Aoyama, S.
Watanabe, T.
Isobe, K.
Kawahito, S.
Source :: IEEE Transactions on Electron Devices. Nov, 2009, Vol. 56 Issue 11, p2414, 9 p.
Publication Year :: 2009

Subjects :: Analog to digital converters -- Design and construction
Complementary metal oxide semiconductors -- Usage
Business
Electronics
Electronics and electrical industries

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