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Power supply noise reduction for at-speed scan testing in linear-decompression environment

Power supply noise reduction for at-speed scan testing in linear-decompression environment

Authors :
Wu, M.-F.
Huang, J.-L.
Wen, X.
Miyase, K.
Source :
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. Nov, 2009, Vol. 28 Issue 11, p1767, 10 p.
Publication Year :
2009

Details

Language :
English
ISSN :
02780070
Volume :
28
Issue :
11
Database :
Gale General OneFile
Journal :
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Publication Type :
Academic Journal
Accession number :
edsgcl.211598007