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Power supply noise reduction for at-speed scan testing in linear-decompression environment
Power supply noise reduction for at-speed scan testing in linear-decompression environment
- Source :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. Nov, 2009, Vol. 28 Issue 11, p1767, 10 p.
- Publication Year :
- 2009
- Subjects :
- Embedded system
System on a chip
Standard IC
Data compression -- Analysis
Embedded systems -- Energy use
Embedded systems -- Design and construction
Integrated circuits -- Design and construction
Semiconductor chips -- Design and construction
Noise reduction systems (Electronics) -- Usage
Subjects
Details
- Language :
- English
- ISSN :
- 02780070
- Volume :
- 28
- Issue :
- 11
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.211598007