ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips

Subjects

Subjects :

Complementary metal oxide semiconductors -- Research
Very-large-scale integration -- Research
Integrated circuits -- Research

Details

ISSN :

02780070

Volume :

v17

Issue :

n8

Database :

Gale General OneFile

Journal :

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Publication Type :

Academic Journal

Accession number :

edsgcl.21201943