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Diagnostics for Gaussian process emulators

Authors :
Bastos, Leonardo S.
O'Hagan, Anthony
Bayarri, M. J.
Steinberg, David M.
Berger, Jim
Source :
Technometrics. Nov, 2009, Vol. 51 Issue 4, p425, 14 p.
Publication Year :
2009

Details

Language :
English
ISSN :
00401706
Volume :
51
Issue :
4
Database :
Gale General OneFile
Journal :
Technometrics
Publication Type :
Academic Journal
Accession number :
edsgcl.215880077