A mechanism versus SEU impact analysis of collector charge collection in SiGe HBT current mode logic

Subjects

Subjects :

Charge transfer -- Analysis
Ionization -- Models
Integrated circuits -- Electric properties
Semiconductor chips -- Electric properties
Standard IC
Business
Electronics
Electronics and electrical industries

Details

Language :

English

ISSN :

00189499

Volume :

56

Issue :

6

Database :

Gale General OneFile

Journal :

IEEE Transactions on Nuclear Science

Publication Type :

Academic Journal

Accession number :

edsgcl.216998394