Temperature dependence of digital single-event transients in bulk and fully-depleted SOI technologies

Subjects

Subjects :

Silicon-on-isolator -- Thermal properties
Silicon-on-isolator -- Electric properties
Heavy ions -- Electric properties
Heavy ions -- Thermal properties
Business
Electronics
Electronics and electrical industries

Details

Language :

English

ISSN :

00189499

Volume :

56

Issue :

6

Database :

Gale General OneFile

Journal :

IEEE Transactions on Nuclear Science

Publication Type :

Academic Journal

Accession number :

edsgcl.217001892