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Analysis of the dynamic behavior of a self-commuted BTB system during line faults

Authors :
Pham, Phuong Viet
Hagiwara, Makoto
Akagi, Hirofumi
Source :
IEEE Transactions on Power Electronics. Jan-Feb, 2010, Vol. 25 Issue 1-2, p322, 9 p.
Publication Year :
2010

Details

Language :
English
ISSN :
08858993
Volume :
25
Issue :
1-2
Database :
Gale General OneFile
Journal :
IEEE Transactions on Power Electronics
Publication Type :
Academic Journal
Accession number :
edsgcl.222044547