Effect of local surface potential distribution on its relaxation in polycrystalline ferroelectric films

Authors :: Yunseok Kim
Yong Kwan Kim
Hyoungsoo Ko
Jiyoon Kim
Kwangsoo No
Moonkyu Park
Buhlmann, Simon
Seungbum Hong
Source :: Journal of Applied Physics. March 1, 2010, Vol. 107 Issue 5, 054103-1-054103-5
Publication Year :: 2010
Abstract: The effect of local surface potential distribution on its relaxation in the polycrystalline ferroelectric thin films is analyzed. The results have shown that the surface potential distribution has affected the reliability of bit signal on the memory devices.

Subjects :: Ferroelectric devices -- Analysis
Lead compounds -- Electric properties
Polarization (Electricity) -- Analysis
Physics

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