A new 12-term open-short-load de-embedding method for accurate on-wafer characterization of RF MOSFET structures

Subjects

Subjects :

Calibration -- Methods
Embedded systems -- Design and construction
Metal oxide semiconductor field effect transistors -- Design and construction
Microwaves -- Measurement
Embedded system
System on a chip
Business
Computers
Electronics
Electronics and electrical industries

Details

Language :

English

ISSN :

00189480

Volume :

58

Issue :

2

Database :

Gale General OneFile

Journal :

IEEE Transactions on Microwave Theory and Techniques

Publication Type :

Academic Journal

Accession number :

edsgcl.223567373