Lead-free potassium bismuth titanate thin film with complex Aurivillius layer structure

Authors :: Cheng, Z.X.
Wang, X.L.
Zhao, H.Y.
Kimura, H.
Source :: Journal of Applied Physics. April 15, 2010, Vol. 107 Issue 8, 084105-1-084105-4
Publication Year :: 2010
Abstract: A ferroelectric thin film of Aurivillius phase [K.sub.0.5][Bi.sub.4.5][Ti.sub.4][O.sub.15] (KBT) with a complex bismuth layer-structure is prepared by using the pulsed laser deposition method. The thin film grown on Pt/Ti/Si[O.sub.2]/Si substrate has shown a strong c-axis orientation and Pt/KBT/Pt capacitor has shown a maximum polarization.

Subjects :: Bismuth -- Electric properties
Ferroelectric crystals -- Structure
Ablation (Vaporization technology) -- Usage
Platinum -- Electric properties
Silica -- Structure
Silica -- Electric properties
Titanium alloys -- Electric properties
Physics

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