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Simulated plasma immersion ion implantation processing of thin wires
- Source :
- Journal of Applied Physics. Sept 15, 2010, Vol. 108 Issue 6, 063308-1-063308-4
- Publication Year :
- 2010
-
Abstract
- Several analytical simulation studies are conducted to explain the mechanisms involved in the plasma immersion ion implantation processing of the various thin wires. The impact of the substrate geometry on the sheath expansion and ion flux density of these wires is also analyzed.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 108
- Issue :
- 6
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.241004838