Fabrication and characterization of relaxor ferroelectric Pb[Fe.sub.1/2][Ta.sub.1/2][O.sub.3] thin film: a comparison with ceramics

Highly oriented Pb([Fe.sub.1/2][Ta.sub.1/2])[O.sub.3] (PFT) film is prepared on conducting [La.sub.0.67][Sr.sub.0.33]Co[O.sub.3] coated (100) MgO substrate by using pulsed laser deposition method. A large shift in dielectric maximum temperature is observed when compared to bulk counterpart that is due to misfit strain across substrate-bottom electrode-film interface and in plane compressive strain in the film.