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High and balanced hole and electron mobilities from ambipolar thin-film transistors based on nitrogen-containing oligoacences
- Source :
- Journal of the American Chemical Society. Nov 24, 2010, Vol. 132 Issue 46, 16349-16351
- Publication Year :
- 2010
-
Abstract
- A strategy is described for designing high-performance, ambipolar, acene-based field-effect transistor (FET) materials, which is based on the replacement of C-H moieties by nitrogen atoms in oligoacenes. The demonstration of high and balanced ambipolar FET properties from nitrogen-containing oligoacenes has provided new opportunities for designing high-performance ambipolar organic semiconductors.
Details
- Language :
- English
- ISSN :
- 00027863
- Volume :
- 132
- Issue :
- 46
- Database :
- Gale General OneFile
- Journal :
- Journal of the American Chemical Society
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.244998695