Eliminating thickness dependence of critical current density in Y[Ba.sub.2][Cu.sub.3][O.sub.7-x] films

Authors :: Xiang Wang
Baca, F. Javier
Emergo, Rose L.S.
Wu, Judy Z.
Haugan, Timothy J.
Barnes, Paul N.
Source :: Journal of Applied Physics. Dec 1, 2010, Vol. 108 Issue 11, 113911-1-113911-5
Publication Year :: 2010
Abstract: The thickness dependence of critical current density ([J.sub.c]) is examined in Y[Ba.sub.2][Cu.sub.3][O.sub.7-x] films with BaZr[O.sub.3] (BZO) nanorods (YBCO/BZO) aligned along the film normal. The results have shown that the thickness dependence of [J.sub.c] is dictated by the microstructure and hence pinning mechanism in YBCO films.

Subjects :: Barium compounds -- Structure
Barium compounds -- Electric properties
Copper oxide superconductors -- Electric properties
Copper oxide superconductors -- Structure
Copper oxide superconductors -- Mechanical properties
Yttrium -- Mechanical properties
Yttrium -- Electric properties
Zirconium -- Mechanical properties
Zirconium -- Electric properties
Physics

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