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Program models FET in three dimensions

Authors :
Young, Jeremy
Source :
Electronics. Feb 9, 1984, Vol. v57, p149, 2 p.
Publication Year :
1984

Subjects

Subjects :
Dalsa Inc. -- Research
Waterloo, University of -- Research
Bipolar transistors -- Testing
Microelectronics -- Testing
Software -- Innovations

Details

ISSN :
08834989
Volume :
v57
Database :
Gale General OneFile
Journal :
Electronics
Publication Type :
Periodical
Accession number :
edsgcl.3131743

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Authors Abstract Subjects Details