Effects of negative-bias operation and optical stress on dark current in CMOS image sensors

MLA

Watanabe, T., et al. “Effects of Negative-Bias Operation and Optical Stress on Dark Current in CMOS Image Sensors.” IEEE Transactions on Electron Devices, vol. 57, no. 7, July 2010, p. 1512. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.316955580&authtype=sso&custid=ns315887.

APA

Watanabe, T., Jong-Ho Park, Aoyama, S., Isobe, K., & Kawahito, S. (2010). Effects of negative-bias operation and optical stress on dark current in CMOS image sensors. IEEE Transactions on Electron Devices, 57(7), 1512.

Chicago

Watanabe, T., Jong-Ho Park, S. Aoyama, K. Isobe, and S. Kawahito. 2010. “Effects of Negative-Bias Operation and Optical Stress on Dark Current in CMOS Image Sensors.” IEEE Transactions on Electron Devices 57 (7): 1512. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.316955580&authtype=sso&custid=ns315887.