A new multipulse technique for probing electron trap energy distribution in high- \kappa materials for flash memory application

Subjects

Subjects :

Flash memory -- Innovations
Distribution (Probability theory) -- Usage
Silicon -- Electric properties
Aluminum -- Electric properties
Simulation methods -- Usage
Flash memory
Business
Electronics
Electronics and electrical industries

Details

Language :

English

ISSN :

00189383

Volume :

57

Issue :

10

Database :

Gale General OneFile

Journal :

IEEE Transactions on Electron Devices

Publication Type :

Academic Journal

Accession number :

edsgcl.317096624