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Evaluation of guarded high-resistance Hamon transfer standards

Authors :
Jarrett, Dean G.
Source :
IEEE Transactions on Instrumentation & Measurement. April, 1999, Vol. 48 Issue 2, p324, 5 p.
Publication Year :
1999

Subjects

Subjects :
Electric resistance -- Standards
Charge transfer -- Standards
Wheatstone bridge -- Research
Electric measurements -- Research
Resistors -- Research

Details

ISSN :
00189456
Volume :
48
Issue :
2
Database :
Gale General OneFile
Journal :
IEEE Transactions on Instrumentation & Measurement
Publication Type :
Academic Journal
Accession number :
edsgcl.55684744

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