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Interfacial microstructures in ramp type multilayer Josephson junctions studied by TEM
- Source :
- IEEE Transactions on Applied Superconductivity. June, 1999, Vol. 9 Issue 2, p3145, 4 p.
- Publication Year :
- 1999
-
Abstract
- Research was conducted to examine the microstructures of high critical temperature ramp type Josephson junctions using transmission electron microscopy. The objective was to reveal the possible origins which lead to the difficulty in reproducing the ramp type Josephson junctions. The influences of the ramp slope angles on the microstructure of the junctions were analyzed.
Details
- ISSN :
- 10518223
- Volume :
- 9
- Issue :
- 2
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Applied Superconductivity
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.55883761