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Interaction induced by nonuniform self-fields in stacks of two long Josephson junctions
- Source :
- IEEE Transactions on Applied Superconductivity. June, 1999, Vol. 9 Issue 2, p3953, 4 p.
- Publication Year :
- 1999
-
Abstract
- A study fabricated and tested devices consisting of two long, Nb/AlOx/Nb/AlOx/Nb, stacked Josephson junctions with direct access to the intermediate electrode, whose thickness is smaller than London penetration depth. The electrodes in these stacks are patterned such that the junctions can be independently biased in the double overlap geometry. It is shown that because of weak dependence from the junction length, the interaction due to the bias currents should not be negligible in three-terminal devices with double overlap geometry.
Details
- ISSN :
- 10518223
- Volume :
- 9
- Issue :
- 2
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Applied Superconductivity
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.55884010