Scatter Corrections in X-Ray Computed Tomography: A Physics-Based Analysis

Authors :: Levine, Zachary H.
Blattner, Timothy J.
Peskin, Adele P.
Pintar, Adam L.
Source :: Journal of Research of the National Institute of Standards and Technology. Annual, 2019, Vol. 124
Publication Year :: 2019
Abstract: 1. Introduction As originally conceived, X-ray computed tomography (CT) finds a material- dependent parameter from observations based on line integrals characterizing the absorption of X-rays in a sample, known in [...]

Subjects :: United States. National Institute of Standards and Technology -- Analysis
Monte Carlo methods -- Analysis
CAT scans -- Analysis
Chemistry
Physics
Science and technology

Language :: English
ISSN :: 1044677X
Volume :: 124
Database :: Gale General OneFile
Journal :: Journal of Research of the National Institute of Standards and Technology
Publication Type :: Academic Journal
Accession number :: edsgcl.593028299
Full Text :: https://doi.org/10.6028/jres.124.013