Study Data from Technical University Provide New Insights into Machine Learning (nanite: using machine learning to assess the quality of atomic force microscopy-enabled nano-indentation data)

Source :: Information Technology Newsweekly. September 24, 2019, 651
Publication Year :: 2019
Abstract: 2019 SEP 24 (VerticalNews) -- By a News Reporter-Staff News Editor at Information Technology Newsweekly -- Investigators publish new report on Machine Learning. According to news reporting originating from Dresden, [...]

Subjects :: Microscopy -- Research
Atomic force microscopy -- Research
Machine learning -- Research
Technology
Editors
Computers

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