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Photoluminescence excitation measurements on erbium implanted GaN

Authors :
Torvik, J.T.
Feuerstein, R.J.
Qiu, C.H.
Pankove, J.I.
Namavar, F.
Source :
Journal of Applied Physics. August 15, 1997, Vol. 82 Issue 4, p1824, 4 p.
Publication Year :
1997

Abstract

Temperature dependence of the optical excitation cross-section of erbium (Er) implanted n-type GaN has been studied with photoluminescence excitation spectroscopy. Photoluminescence excitation spectra showing several Stark splittings had a complex dependence on temperature. Excitation wavelengths were 770-1010 nm, at room temperature and 77K.

Details

ISSN :
00218979
Volume :
82
Issue :
4
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.60384791