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Digital signal processor for test and measurement environment

Authors :
Kareem, Arif
Saxe, Charles L.
Etheridge, Eric
McKinney, David
Source :
Proceedings of the IEEE. Sept, 1987, Vol. v75 Issue n9, p1167, 5 p.
Publication Year :
1987

Details

ISSN :
00189219
Volume :
v75
Issue :
n9
Database :
Gale General OneFile
Journal :
Proceedings of the IEEE
Publication Type :
Academic Journal
Accession number :
edsgcl.6097265