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Characterization of the MIC/MILC interface and its effects on the performance of MILC thin-film transistors
- Source :
- IEEE Transactions on Electron Devices. May, 2000, Vol. 47 Issue 5, p1061, 7 p.
- Publication Year :
- 2000
-
Abstract
- The crystallization of amorphous silicon by metal-induced crystallization and metal-induced lateral crystallization was undertaken.
Details
- ISSN :
- 00189383
- Volume :
- 47
- Issue :
- 5
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.64700769