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U.S. Naval Research Laboratory Reports Findings in Science (Nanoscale Infrared Spectroscopic Characterization of Extended Defects in 4H-Silicon Carbide)

Source :
Electronics Newsweekly. January 16, 2024, 336
Publication Year :
2024

Abstract

2024 JAN 16 (VerticalNews) -- By a News Reporter-Staff News Editor at Electronics Newsweekly -- New research on Science is the subject of a report. According to news originating from [...]

Subjects

Subjects :
United States. Naval Research Laboratory -- Reports
Semiconductors -- Reports
Infrared spectroscopy -- Reports
Electronics industry -- Reports
Silicon carbide -- Reports
Silicon -- Reports
Electronics industry
Electronics

Details

Language :
English
ISSN :
19441630
Database :
Gale General OneFile
Journal :
Electronics Newsweekly
Publication Type :
News
Accession number :
edsgcl.779316735

Tools

Authors Abstract Subjects Details