Thermally activated deterioration processes in Co/Cu GMR multilayers

Authors :: Hecker, M.
Tietjen, D.
Elefant, D.
Schneider, C.M.
Qiu, An
Cramer, N.
Camley, R.E.
Celinski, Z.
Source :: Journal of Applied Physics. June 1, 2001, Vol. 89 Issue 11, p7113, 3 p.
Publication Year :: 2001
Abstract: Research into the structural and magnetic properties of sputtered Co/Cu multilayers in the pre- and postannealed states is presented. It was established that the interfaces in sputtered Co/Cu multilayers stay sharp and stable during annealing up to 600 deg C.