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Interface state generation after hold injection

Authors :
Zhao, C.Z.
Zhang, J.F.
Groeseneken, G.
Degraeve, R.
Ellis, J.N.
Beech, C.D.
Source :
Journal of Applied Physics. July 1, 2001, Vol. 90 Issue 1, p328, 9 p.
Publication Year :
2001

Abstract

The interface state generation after hole injection is investigated, and two independent processes were found to cause generation, including H2 cracking.

Details

ISSN :
00218979
Volume :
90
Issue :
1
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.78827187