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Interface state generation after hold injection
- Source :
- Journal of Applied Physics. July 1, 2001, Vol. 90 Issue 1, p328, 9 p.
- Publication Year :
- 2001
-
Abstract
- The interface state generation after hole injection is investigated, and two independent processes were found to cause generation, including H2 cracking.
- Subjects :
- Surface chemistry -- Research
Physics
Subjects
Details
- ISSN :
- 00218979
- Volume :
- 90
- Issue :
- 1
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.78827187