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Tool slashes digital-IC test time on existing testers; barely affects fault coverage, die size, or device-design time
- Source :
- EDN. October 11, 2001, Vol. 46 Issue 23, 26
- Publication Year :
- 2001
-
Abstract
- IF YOU DESIGN OR DEVELOP tests for complex digital ICs, you should consider Mentor Graphics' TestKompress. The vendor says that the tool cuts device-test times by at least 60% without [...]
- Subjects :
- Mentor Graphics Corp. -- Product introduction
Mentor Graphics TestKompress (Debugging/testing software) -- Product introduction
Computer software industry -- Product introduction
Software -- Product introduction
Debugging software -- Product introduction
Business
Electronics and electrical industries
Software quality
Debugging/testing software
Product introduction
Subjects
Details
- Language :
- English
- ISSN :
- 00127515
- Volume :
- 46
- Issue :
- 23
- Database :
- Gale General OneFile
- Journal :
- EDN
- Publication Type :
- Periodical
- Accession number :
- edsgcl.79573007