Probing the structure of organosilane films by solvent swelling and neutron and X-ray reflection

Authors :: Yim, H.
Kent, M. S.
Hall, J. S.
Benkoski, J. J.
Kramer, E. J.
Source :: Journal of Physical Chemistry B. March 14, 2002, Vol. 106 Issue 10, p2474, 8 p.
Publication Year :: 2002

Subjects :: Chemistry, Physical and theoretical -- Research
Silane -- Physiological aspects
Thin films -- Physiological aspects
Solvents -- Physiological aspects
Neutrons -- Physiological aspects
Chemicals, plastics and rubber industries

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